CellSpot EL/PL System

  • Budget-friendly Electroluminescence (EL) and Photoluminescence (PL) inspection system for solar cells and wafers.
  • Visible LED-based PL light source with no infrared (IR) laser safety risk.
  • IR-filtered illumination for enhanced image quality and reduced background noise.
  • Variable light intensity adjustable up to 1/3 Sun per light source.
  • High-resolution EL/PL camera equipped with optical filters for defect detection.
  • Lightproof enclosure for accurate and repeatable imaging.
  • Includes IMPEL image analysis software for image acquisition, enhancement, and analysis.
  • Supports Mono Wafers, Multi Wafers, Mono Cells, and Perovskite Cells.
  • Optional EL fixture available for electroluminescence testing.