Evaporation System
Features
- Multi-source co-deposition for large-area coating
- Precise thermal field and temperature control
Technical Parameters
- Film Thickness Non-uniformity : ≤5% (within wafer, wafer-to-wafer, batch-to-batch)
- Deposition Speed Stability : ≤±0.5%
- Temperature Control Precision : ±1%
- Temperature Fluctuation : ±2 °C
- Width : 600 mm


